KANG JIN GANG; ANG LING WEAY. Systematic Review: Advances in Machine Learning Frameworks for Predicting Patent Infringements. International Journal of Sciences: Basic and Applied Research (IJSBAR), Jordan, v. 76, n. 1, p. 83–91, 2025. Disponível em: https://www.gssrr.org/JournalOfBasicAndApplied/article/view/17329. Acesso em: 3 nov. 2025.