KANG JIN GANG; ANG LING WEAY. Systematic Review: Advances in Machine Learning Frameworks for Predicting Patent Infringements. International Journal of Sciences: Basic and Applied Research (IJSBAR), [S. l.], v. 76, n. 1, p. 83–91, 2025. Disponível em: https://www.gssrr.org/index.php/JournalOfBasicAndApplied/article/view/17329. Acesso em: 23 jun. 2025.